Step coverage of the barrier films deposited onto patterned photoresist
Crossref DOI link: https://doi.org/10.1007/s00542-017-3690-4
Published Online: 2018-01-08
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Tai-Hong
Chang, Chun-Hao
Lin, Sheng-Fu
Su, Yong-Ji
Liu, Hua-Wen
Chen, Shun-Chi
Liu, Day-Shan
Funding for this research was provided by:
Industrial Technology Research Institute (TW) (A200-106BA2)
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