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Finite element simulation of a highly sensitive SH-SAW delay line sensor with SiO $$_{2}$$ 2 micro-ridges

Crossref DOI link: https://doi.org/10.1007/s00542-018-3772-y

Published Online: 2018-02-10

Published Print: 2018-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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