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Low power and high speed design issues of CMOS  Hamming code generation and error detection circuit at 22 nm and 16 nm channel length of MOS transistor

Crossref DOI link: https://doi.org/10.1007/s00542-018-4143-4

Published Online: 2018-09-22

Published Print: 2021-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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