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Fundamental frequencies of a torsional cantilever nano beam for dynamic atomic force microscopy (dAFM) in tapping mode

Crossref DOI link: https://doi.org/10.1007/s00542-018-4166-x

Published Online: 2018-10-22

Published Print: 2019-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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