Contamination assessment of insulators using microsystem technology with fuzzy-based approach
Crossref DOI link: https://doi.org/10.1007/s00542-019-04538-5
Published Online: 2019-07-30
Published Print: 2021-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Yi-Che
Lin, Yen-Ting
Chang, Hong-Chan
Kuo, Cheng-Chien https://orcid.org/0000-0003-4990-0459
Text and Data Mining valid from 2019-07-30
Version of Record valid from 2019-07-30
Article History
Received: 26 April 2019
Accepted: 5 July 2019
First Online: 30 July 2019