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Negative bias temperature instability (NBTI) effects on p-Si/n-InGaAs hybrid CMOSFETs for digital applications

Crossref DOI link: https://doi.org/10.1007/s00542-019-04646-2

Published Online: 2019-10-04

Published Print: 2020-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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