The effects on residual stress in multilayer NTC thermistors during soldering process and bending test (I. soldering process)
Crossref DOI link: https://doi.org/10.1007/s00542-020-04855-0
Published Online: 2020-05-11
Published Print: 2020-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Nam Chol
Ri, Yong Ho
Kim, Chol Man
Text and Data Mining valid from 2020-05-11
Version of Record valid from 2020-05-11
Article History
Received: 10 April 2020
Accepted: 16 April 2020
First Online: 11 May 2020