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Material loss of silicon nitride thin films in a simulated ocular environment

Crossref DOI link: https://doi.org/10.1007/s00542-020-05096-x

Published Online: 2020-11-17

Published Print: 2021-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Schade, Christoph

Phan, Alex

Joslin, Kevin

Talke, Frank E. https://orcid.org/0000-0002-6822-6036
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Text and Data Mining valid from 2020-11-17

Version of Record valid from 2020-11-17
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Article History

Received: 24 October 2020

Accepted: 1 November 2020

First Online: 17 November 2020