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Stress-induced electric potential barriers in thickness-stretch deformations of a piezoelectric semiconductor plate

Published Online: 2021-09-30

Published Print: 2021-11

Authors

Qu, Yilin

Jin, Feng

Yang, Jiashi https://orcid.org/0000-0003-3971-1240
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (12072253)

111 Project (version 2.0)

Fundamental Research Funds for the Central Universities (xzy022020016)
License Information

Text and Data Mining valid from 2021-09-30

Version of Record valid from 2021-09-30
More Information

Article History

Received: 19 May 2021

Revised: 14 July 2021

Accepted: 2 August 2021

First Online: 30 September 2021

Declarations

:

: On behalf of all authors, the corresponding author states that there is no conflict of interest.

: The data that supports the findings of this study are available within the article.

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