Voltammetry of chemically deposited Cu x O electrochromic films, coated with ZnO or TiO2 electrocatalyst layers
Crossref DOI link: https://doi.org/10.1007/s10008-014-2666-x
Published Online: 2014-10-31
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ristova, M. M.
Mirceski, V.
Neskovska, R.
Text and Data Mining valid from 2014-10-31