Automatic analog meter reading for plant inspection using a deep neural network
Crossref DOI link: https://doi.org/10.1007/s10015-020-00662-y
Published Online: 2020-10-21
Published Print: 2021-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Funayama, Yuki
Nakamura, Keita
Tohashi, Kenta
Matsumoto, Taku
Sato, Akira
Kobayashi, Shigeki
Watanobe, Yutaka
Text and Data Mining valid from 2020-10-21
Version of Record valid from 2020-10-21
Article History
Received: 13 April 2020
Accepted: 25 September 2020
First Online: 21 October 2020