Full-field measurement of surface reflectivity using a microscopy for refractive index profiling of GRIN lenses
Crossref DOI link: https://doi.org/10.1007/s10043-016-0249-z
Published Online: 2016-07-27
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Weng, Chun-Jen
Chen, Chih-Yen
Hwang, Chi-Hung
Liu, Da-Ren
Funding for this research was provided by:
Ministry of Science and Technology, Taiwan (104-2221-E-492 -036 -MY2, MOST 105-2622-E-492-005 -CC3)
License valid from 2016-07-27