MDUA-YOLO: an advanced deep learning approach for PCB surface defect detection
Crossref DOI link: https://doi.org/10.1007/s10044-025-01526-6
Published Online: 2025-08-29
Published Print: 2025-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Xiaowei
Wang, Haichao
Text and Data Mining valid from 2025-08-29
Version of Record valid from 2025-08-29
Article History
Received: 25 December 2024
Accepted: 5 July 2025
First Online: 29 August 2025
Declarations
:
: The authors declare no Conflict of interest.
: This declaration is not applicable.