Correction to: An automated assessment method for integrated circuit chip detachment from printed circuit board by multistep binarization and template matching of X-ray transmission images
Crossref DOI link: https://doi.org/10.1007/s10163-020-01144-w
Published Online: 2020-12-05
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ueda, Takao http://orcid.org/0000-0002-6206-2085
Oki, Tatsuya
Koyanaka, Shigeki
Text and Data Mining valid from 2020-12-05
Version of Record valid from 2020-12-05
Article History
First Online: 5 December 2020