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Defect-scanner: a comparative empirical study on language model and deep learning approach for software vulnerability detection

Published Online: 2024-08-13

Published Print: 2024-12

Authors

Pham, Van-Hau

Hien, Do Thi Thu

Hoang, Hien Do

Duy, Phan The
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Text and Data Mining valid from 2024-08-13

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First Online: 13 August 2024

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: The authors have no Conflict of interest to declare that are relevant to the content of this article.

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