Variable slice thickness (VAST) EPI for the reduction of susceptibility artifacts in whole-brain GE-EPI at 7 Tesla
Crossref DOI link: https://doi.org/10.1007/s10334-017-0641-0
Published Online: 2017-07-10
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Brunheim, Sascha http://orcid.org/0000-0001-9341-797X
Johst, Sören
Pfaffenrot, Viktor
Maderwald, Stefan
Quick, Harald H.
Poser, Benedikt A.
License valid from 2017-07-10