Two-dimensional analysis of progressive delamination in thin film electrodes
Crossref DOI link: https://doi.org/10.1007/s10409-017-0692-5
Published Online: 2017-06-28
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Mei
Lu, Bo
Shi, Dong-Li
Zhang, Jun-Qian
License valid from 2017-06-28