A self-supervised BEiT model with a novel hierarchical patchReducer for efficient facial deepfake detection
Crossref DOI link: https://doi.org/10.1007/s10462-025-11286-8
Published Online: 2025-06-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Al Redhaei, Aneesa
Fraihat, Salam
Al-Betar, Mohammed Azmi
Text and Data Mining valid from 2025-06-12
Version of Record valid from 2025-06-12
Article History
Accepted: 30 May 2025
First Online: 12 June 2025
Declarations
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: The authors have no Conflict of interest to declare that are relevant to the content of this article.