A general method for analog test point selection using multi-frequency analysis
Crossref DOI link: https://doi.org/10.1007/s10470-015-0565-4
Published Online: 2015-05-29
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lei, Huajun http://orcid.org/0000-0003-0900-3622
Qin, Kaiyu
Text and Data Mining valid from 2015-05-29