Crossmark

A compact model for flicker noise in MOSFETs considering both correlated mobility and carrier number fluctuations

Crossref DOI link: https://doi.org/10.1007/s10470-016-0836-8

Published Online: 2016-08-13

Published Print: 2016-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Arnaud, Alfredo https://orcid.org/0000-0002-7122-5421
Hoffmann, Alain
Funding

Funding for this research was provided by:

Agencia Nacional de Investigación e Innovación (FCE7091)

EC Erasmus Mundus PEACE programme
License Information

License valid from 2016-08-13