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Simulation of driver fatigue monitoring via blink rate detection, using 65 nm CMOS technology

Crossref DOI link: https://doi.org/10.1007/s10470-018-1151-3

Published Online: 2018-03-08

Published Print: 2018-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Yassine, Nabil https://orcid.org/0000-0001-6738-7658
Barker, Steve

Hayatleh, Khaled

Choubey, Bhaskar

Nagulapalli, Rajasekhar
License Information

Text and Data Mining valid from 2018-03-08
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Article History

Received: 4 December 2017

Revised: 26 February 2018

Accepted: 2 March 2018

First Online: 8 March 2018