A test point selection approach for DC analog circuits with large number of predefined faults
Crossref DOI link: https://doi.org/10.1007/s10470-019-01550-7
Published Online: 2019-11-02
Published Print: 2020-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khanlari, Masoumeh
Ehsanian, Mehdi http://orcid.org/0000-0003-1050-9428
Text and Data Mining valid from 2019-11-02
Version of Record valid from 2019-11-02
Article History
Received: 25 June 2019
Revised: 25 June 2019
Accepted: 3 October 2019
First Online: 2 November 2019