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Thermal readout noise comparison of classical constant bias APS and switching bias APS used in CMOS image sensors

Crossref DOI link: https://doi.org/10.1007/s10470-021-01964-2

Published Online: 2021-11-17

Published Print: 2022-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Carvalho Freitas, Luis Miguel https://orcid.org/0000-0002-8608-9733
Morgado-Dias, Fernando
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Text and Data Mining valid from 2021-11-17

Version of Record valid from 2021-11-17
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Article History

Received: 1 March 2021

Revised: 16 September 2021

Accepted: 3 November 2021

First Online: 17 November 2021