Investigating the effects of interface trap charges and temperature on n-type step tunneling path TFET
Crossref DOI link: https://doi.org/10.1007/s10470-025-02505-x
Published Online: 2025-09-10
Published Print: 2025-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Saha, Jatismar
Gogoi, Manosh Protim
Choudhuri, Bijit
Saha, Rajesh
Text and Data Mining valid from 2025-09-10
Version of Record valid from 2025-09-10
Article History
Received: 14 May 2025
Revised: 26 July 2025
Accepted: 1 September 2025
First Online: 10 September 2025
Declarations
:
: The authors declare no competing interests.