Sensitivity analysis of pull-in voltage for RF MEMS switch based on modified couple stress theory
Crossref DOI link: https://doi.org/10.1007/s10483-015-2005-6
Published Online: 2015-11-17
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhu, Junhua
Liu, Renhuai
Text and Data Mining valid from 2015-11-17