High Sensitivity Silicon Slit Detectors for 1 nm Powder XRD Size Detection Limit
Crossref DOI link: https://doi.org/10.1007/s10562-015-1479-6
Published Online: 2015-01-21
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
O’Connell, K.
Regalbuto, John R.
Text and Data Mining valid from 2015-01-21