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Comparative analysis of machine learning and deep learning approaches for fault detection in industrial applications using CWRU, IMS, and TEP datasets

Crossref DOI link: https://doi.org/10.1007/s10586-026-06008-w

Published Online: 2026-03-30

Published Print: 2026-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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