Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method
Crossref DOI link: https://doi.org/10.1007/s10598-016-9345-y
Published Online: 2016-12-17
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lopushenko, V. V.
License valid from 2016-12-17