Finite Sample Lag Adjusted Critical Values and Probability Values for the Fourier Wavelet Unit Root Test
Crossref DOI link: https://doi.org/10.1007/s10614-023-10458-4
Published Online: 2023-09-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sephton, Peter S. http://orcid.org/0000-0002-8871-6649
Text and Data Mining valid from 2023-09-01
Version of Record valid from 2023-09-01
Article History
Accepted: 9 August 2023
First Online: 1 September 2023
Declarations
:
: The author declares he has no financial or non-financial interests to disclose.