Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
Crossref DOI link: https://doi.org/10.1007/s10696-023-09504-y
Published Online: 2023-08-01
Published Print: 2024-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Deenen, Patrick C. http://orcid.org/0000-0002-0623-9982
Middelhuis, Jeroen
Akcay, Alp
Adan, Ivo J. B. F.
Text and Data Mining valid from 2023-08-01
Version of Record valid from 2023-08-01
Article History
Accepted: 18 July 2023
First Online: 1 August 2023