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Exact and heuristic approaches for scheduling parallel stress test machines in semiconductor reliability laboratories

Published Online: 2025-07-14

Authors

Hautz, Jessica

Klemmt, Andreas

Mönch, Lars https://orcid.org/0000-0003-2230-8463
Funding

Funding for this research was provided by:

FernUniversität in Hagen
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Text and Data Mining valid from 2025-07-14

Version of Record valid from 2025-07-14
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Article History

Accepted: 21 June 2025

First Online: 14 July 2025

Declarations

:

: The authors have no competing interests to declare that are relevant to the content of this article.

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