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Direct observation of the thickness effect on critical crack tip opening displacement in freestanding copper submicron-films by in situ electron microscopy fracture toughness testing

Crossref DOI link: https://doi.org/10.1007/s10704-015-0003-8

Published Online: 2015-02-12

Published Print: 2015-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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