Higher order Cauchy–Born rule based multiscale cohesive zone model and prediction of fracture toughness of silicon thin films
Crossref DOI link: https://doi.org/10.1007/s10704-016-0147-1
Published Online: 2016-08-31
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Urata, Shingo
Li, Shaofan https://orcid.org/0000-0002-6950-1474
License valid from 2016-08-31