Prediction of multi-cracking in sub-micron films using the coupled criterion
Crossref DOI link: https://doi.org/10.1007/s10704-017-0255-6
Published Online: 2017-11-29
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Leguillon, Dominique
Martin, Eric
License valid from 2017-11-29