Optimization of process parameters for the pseudocapacitive properties of Cu2O thin films prepared by r.f. magnetron sputtering
Crossref DOI link: https://doi.org/10.1007/s10751-026-02398-w
Published Online: 2026-03-14
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shaik, Dadamiah P. M. D.
Lakkimsetty, Nageswara Rao
Karu, Clement Varaprasad
Text and Data Mining valid from 2026-03-14
Version of Record valid from 2026-03-14
Article History
Received: 11 December 2025
Accepted: 14 February 2026
First Online: 14 March 2026
Declarations
:
: The authors declare no competing interests.