2D and 3D Terahertz Imaging and X-Rays CT for Sigillography Study
Crossref DOI link: https://doi.org/10.1007/s10762-017-0356-3
Published Online: 2017-01-21
Published Print: 2017-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fabre, M.
Durand, R.
Bassel, L.
Recur, B.
Balacey, H.
Bou Sleiman, J.
Perraud, J.-B.
Mounaix, P.
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