Terahertz Frequency Metrology for Spectroscopic Applications: a Review
Crossref DOI link: https://doi.org/10.1007/s10762-017-0406-x
Published Online: 2017-07-25
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Consolino, L. http://orcid.org/0000-0003-3771-8924
Bartalini, S.
De Natale, P.
License valid from 2017-07-25