Spectroscopic characterization and photoactivity of SiO x -based films electrochemically grown on Cu surfaces
Crossref DOI link: https://doi.org/10.1007/s10800-017-1089-7
Published Online: 2017-05-26
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Krywko-Cendrowska, Agata
Marot, Laurent
Philippe, Laetitia
Strawski, Marcin
Meyer, Ernst
Szklarczyk, Marek
License valid from 2017-05-26