Solution of the Inverse Spectroscopic Ellipsometry Problem for an Absorbing Substrate with a Dielectric Layer
Crossref DOI link: https://doi.org/10.1007/s10812-016-0239-8
Published Online: 2016-03-18
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Stas’kov, N. I.
Shulga, A. V.
Text and Data Mining valid from 2016-03-01