Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions
Crossref DOI link: https://doi.org/10.1007/s10812-016-0240-2
Published Online: 2016-03-18
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bazarov, V. V.
Nuzhdin, V. I.
Valeev, V. F.
Vorobev, V. V.
Osin, Yu. N.
Stepanov, A. L.
Text and Data Mining valid from 2016-03-01