Determination of the Mass Absorption Coefficient in Two-Layer Ti/V and V/Ti Thin Film Systems by the X-Ray Fluorescence Method
Crossref DOI link: https://doi.org/10.1007/s10812-016-0242-0
Published Online: 2016-03-18
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mashin, N. I.
Chernyaeva, E. A.
Tumanova, A. N.
Gafarova, L. M.
Text and Data Mining valid from 2016-03-01