Three-Component Model of an Effective Medium for Determining the Composition of Layers on Silicon Wafers
Crossref DOI link: https://doi.org/10.1007/s10812-017-0542-z
Published Online: 2017-11-17
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Staskov, N. I.
Sotskaya, L. I.
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