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Modeling Transition Layers at Boundaries of Thin-Film Coatings Using Ellipsometric Measurements

Published Online: 2020-01-21

Published Print: 2020-01

Authors

Tikhii, A. A.

Nikolaenko, Yu. M.

Kornievets, A. S.

Svyrydova, K. A.

Zhikhareva, Yu. I.

Zhikharev, I. V.
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Text and Data Mining valid from 2020-01-01

Version of Record valid from 2020-01-01
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Article History

Received: 24 May 2019

First Online: 21 January 2020

Document is current