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Optical Characterization of Native Defects in 4H–SiC Irradiated by 10 MeV Electrons with Subsequent Annealing

Crossref DOI link: https://doi.org/10.1007/s10812-021-01104-8

Published Online: 2021-01-28

Published Print: 2021-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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