Document is current

Variation in Refractive Index and Extinction Coefficient of a Very Thin Copper Film by Thermal Annealing: an Ellipsometric Approach

Crossref DOI link: https://doi.org/10.1007/s10812-023-01637-0

Published Online: 2023-11-24

Published Print: 2023-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy