IR-Fourier Spectroscopy of Attenuated Total Internal Reflection of Polyimide Films on Single-Crystal Silicon Wafers
Crossref DOI link: https://doi.org/10.1007/s10812-024-01721-z
Published Online: 2024-05-10
Published Print: 2024-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Prosolovich, V. S.
Brinkevich, D. I.
Grinyuk, E. V.
Brinkevich, S. D.
Kolos, V. V.
Zubova, O. A.
Lastovskii, S. B.
Text and Data Mining valid from 2024-05-01
Version of Record valid from 2024-05-01
Article History
Received: 2 October 2023
First Online: 10 May 2024