Updates are available Correction dated 2014-08-06

Click to view Correction: https://doi.org/10.1007/s10825-014-0602-z

A new two-dimensional analytical subthreshold behavior model for submicron Triple Material Gate (TM) GaN MESFET

Crossref DOI link: https://doi.org/10.1007/s10825-014-0591-y

Published Online: 2014-06-25

Published Print: 2014-09

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