Modeling of deep-submicron silicon-based MISFETs with calcium fluoride dielectric
Crossref DOI link: https://doi.org/10.1007/s10825-014-0593-9
Published Online: 2014-07-15
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tyaginov, S. E.
Illarionov, Yu. Yu.
Vexler, M. I.
Bina, M.
Cervenka, J.
Franco, J.
Kaczer, B.
Grasser, T.
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