Modeling the back gate effects of AlGaN/GaN HEMTs
Crossref DOI link: https://doi.org/10.1007/s10825-014-0603-y
Published Online: 2014-08-07
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Li
Zhang, Xuefeng
You, Guanjun
Xiong, Feng
Liang, Lixin
Hu, Yong
Chen, Aping
Liu, Jie
Xu, Jian
Text and Data Mining valid from 2014-08-07