Analytic compact model of ballistic and quasi-ballistic transport for cylindrical gate-all-around MOSFET including drain-induced barrier lowering effect
Crossref DOI link: https://doi.org/10.1007/s10825-014-0659-8
Published Online: 2014-12-27
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cheng, He
Uno, Shigeyasu
Nakazato, Kazuo
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